Projection system

ABSTRACT

A projection system includes an invisible light projector, an imaging unit, an image generator, and a visible light projector. The invisible light projector projects a predetermined invisible light image onto the object via invisible light. The imaging unit captures an image of the invisible light projected from the invisible light projector. The image generator measures a shape of the object based on the image captured by the imaging unit to generate image data showing image content for projection onto the object in accordance with the measured shape. The visible light projector projects the image content shown by the image data onto the object via visible light. The invisible light projector emits pulsed invisible light to project the measurement pattern. The image generator generates the image data based on an image captured in accordance with a timing for the pulsed light emission.

BACKGROUND 1. Technical field

The present disclosure relates to a projection system for projecting animage fit for a shape, a position, and the like of an object.

2. Related art

Japanese Laid-Open Patent Publication No. 2015-173431 discloses aprojection system for projection mapping to project image content onto astructure such as a building. In the projection system, a projectionapparatus radiates, onto the structure, image light showing imagecontent and pattern light showing a pattern image in which projectioncoordinates in a projection coordinate system are coded. Further, acapture apparatus captures an image of the pattern image projected ontothe structure. The projection system enables projection mapping whilethe image content is positioned for the structure.

SUMMARY

The present disclosure provides a projection system that projects animage fit for a shape of an object and that is capable of measuring theshape of the object with a high degree of precision.

A projection system according to the present disclosure projects animage fit for a shape of an object. The projection system includes aninvisible light projector, an imaging unit, an image generator, and avisible light projector. The invisible light projector projects apredetermined invisible light image onto the object via invisible light.The imaging unit captures an image of the invisible light projected fromthe invisible light projector. The image generator measures a shape ofthe object based on the image captured by the imaging unit to generateimage data showing image content for projection onto the object inaccordance with the measured shape. The visible light projector projectsthe image content shown by the image data onto the object via visiblelight. The invisible light projector emits pulsed invisible light toproject the measurement pattern. The image generator generates the imagedata based on an image captured in accordance with a timing for thepulsed light emission.

According to the present disclosure, the projection system, whichprojects the image fit for the shape of the object, is capable ofmeasuring the shape of the object with the high degree of precision.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a block diagram showing a configuration of a projection systemaccording to a first embodiment.

FIG. 2 is a drawing for illustrating a theory of three-dimensionalmeasurement used in the projection system.

FIGS. 3A and 3B are drawings for illustrating measurement patterns inaccordance with a space encoding method.

FIG. 4 is a drawing for illustrating functions of filters of theprojection system.

FIG. 5 is a drawing for illustrating a function of pulsed light emissioncontrol in the projection system.

FIGS. 6A to 6G are timing charts showing timings for operation of theprojection system according to the first embodiment.

FIGS. 7A to 7F are timing charts showing timings for operation of aprojection system according to a second embodiment.

FIGS. 8A to 8C are timing charts showing timings for operation of aprojection system according to a variant example of the secondembodiment.

FIGS. 9A to 9C are timing charts showing timings for operation of aprojection system according to a third embodiment.

FIGS. 10A to 10C are timing charts showing timings for operation of aprojection system according to a variant example of the thirdembodiment.

DESCRIPTION OF EMBODIMENTS

Embodiments of the present disclosure will now be described in detailwith reference to the accompanying drawings. However, description inmore detail than is necessary can be omitted. For example, detaileddescriptions of well-known matters and redundant descriptions ofsubstantially identical constituent elements are omitted so as to avoidunnecessarily redundant description and enable those of skill in the artto readily understand the embodiments herein.

The applicant has provided the accompanying drawings and descriptionbelow to allow those of skill in the art to satisfactory understand thepresent disclosure. Accordingly, these examples should not be construedas limiting the spirit and scope of the claims.

First Embodiment 1. Configuration

With reference to FIG. 1, a projection system configuration according toa first embodiment will now be described. FIG. 1 is a block diagramshowing a configuration of a projection system 1 according to thisembodiment.

As shown in FIG. 1, the projection system 1 includes a visible lightprojector 2, an infrared light projector 3, a camera 4, a controller 5,and a screen 10. The projection system 1 according to this embodiment isa projection mapping system for projecting visible light images on asubject 6 such as a person or the like for staging for example. In theprojection system 1, the infrared light projector 3 and the camera 4 isused for measuring a shape and the like of the subject 6 in order to getvisual light image content from the projector 2 to follow the motion ofthe subject 6. The screen 10 is disposed behind the subject 6 inprojecting directions of the projectors 2 and 3.

The visible light projector 2 is a projector using DLP, 3LCD, or LCOStechnology, for example. The visible light projector 2 emits visiblerays to project an image containing various image contents, based onimage signals (image data) received from the controller 5, for example.The visible light projector 2 is an exemplary visible light projector inaccordance with this embodiment. As shown in FIG. 1, the visible lightprojector 2 includes a visible light source 21, a spatial lightmodulator 22, and a projection optical system 23.

In this embodiment, the visible light source 21 includes a plurality ofluminous elements (e.g. LEDs) emitting red, green, and blue rays oflight, respectively. The visible light source 21 may include a solemonochrome luminous element or a white color luminous elementappropriately depending on a projection method adopted for the visiblelight projector 2. The luminous elements may be laser diodes, halogenlamps or the like.

The spatial light modulator 22 includes three spatial light modulationdevices in this embodiment. The spatial light modulation devices can beDMD or LCD chips, or the like. The spatial light modulator 22 may be asingle spatial light modulation device.

The projection optical system 23 includes a zoom lens for defining anangle of view for the visible light projector 2, and a focus lens forfocus adjustment.

The infrared light projector 3 is a projector using DLP, LCD, or LCOStechnology, for example. The infrared light projector 3 projectspredetermined infrared measurement patterns described later on the basisof image signals (image data) received from the controller 5, forexample. The infrared light projector 3 is an exemplary invisible lightprojector that projects invisible light images using invisible light. Inthis embodiment, the infrared light is used as an instance of invisiblelight. Any other invisible light may be used, e.g. ultraviolet light.

With reference to FIG. 1, the infrared light projector 3 includes apulse light source 31, a spatial light modulation device 32, and aprojection optical system 23.

In this embodiment, the pulse light source 31 includes a pulse laserdevice that emits infrared light in oscillating pulses. Based on theoscillating pulses, the pulse light source 31 emits pulsed infraredlight with a pulse width of 0.1 picoseconds to 20 microseconds and apeak wavelength of 800 nm to 900 nm, for example.

The spatial light modulation device 32 is a DMD or LCD chip, or anotherdevice. The spatial light modulation device 32 forms an image on animage formation surface thereof based on image signals from thecontroller 5 or the like. The pulse of infrared light emitted from thepulse light source 31 enters the image formation surface of the spatiallight modulation device 32 such that the infrared light is spatiallymodulated and an invisible light image is produced.

The projection optical system 33 includes a zoom lens for defining anangle of view for the infrared light projector 3, and a focus lens forfocus adjustment.

The projectors 2 and 3 are disposed such that they can emit their raysof light into an identical area with each other, for example. Theprojectors 2 and 3 may be optically coupled each other such that theiroptical axes align with each other. In this case, a dichroic mirror orthe like can be used, which passes visible light with infrared lightreflected or which reflects visible light with infrared light passed.Further, in this case, the projection optical systems 23 and 33 may beintegrated each other. Furthermore, the infrared light projector 3 andthe visible light projector 2 may be integrated each other a singleinstrument.

The camera 4 is disposed at a position that allows the camera 4 tocapture an image of an area into which invisible light images areprojected from the infrared light projector 3. The camera 4 generates acapture image of a measurement pattern that is projected onto thesubject 6 through infrared light. The camera 4 outputs imaging data,which is data showing the capture image, to the controller 5. The camera4 is an exemplary imaging unit in the projection system 1. Withreference to FIG. 1, the camera 4 includes an image pick-up device 41,an imaging lens 42, and a visible light shielding filter 43.

The image pick-up device 41 includes a solid-state image sensing device,e.g. a CCD or CMOS image sensor made primarily from silicon. The imagepick-up device 41 has an imaging surface that contains a plurality ofarranged pixel circuits for receiving light. The principal material usedfor the image pick-up device 41 may be any material, such as germaniumor gallium, other than silicon.

The imaging lens 42 includes a zoom lens for defining an angle of viewfor the camera 4, and a focus lens for focus adjustment.

The visible light shielding filter 43 is a bandpass filter or along-pass filter which transmits infrared light components and absorbsvisible light components of incident light. The visible light shieldingfilter 43 is attached to the imaging lens 42, for example. The visiblelight shielding filter 43 is an exemplary wavelength selector used forthe camera 4 to selectively transmit infrared light.

The visible light shielding filter 43 may be integrated with the imaginglens 42 through means such as forming a coating or a diffraction gratingon the imaging lens 42. Alternatively, the visible light shieldingfilter 43 may be built into an image formation surface or any other partof the image pick-up device 41. The visible light shielding filter 43may be configured to reflect visible light components in place of or inaddition to absorbing visible light components.

The controller 5 is a control device for controlling the abovecomponents of the projection system 1. The controller 5 includes a CPUor an MPU to implement predetermined functions in collaboration withsoftware, for example. With reference to FIG. 1, the controller 5includes an image generator 50 and a storage 51.

The controller 5 reads data and programs stored in the storage 51 toperform various arithmetic operations and realize functions of everykind. For example, the controller 5 implements functions required forthe image generator 50. The controller 5 may control timings for actsperformed by the components such as the camera 4, the infrared lightprojector 3, and the visible light projector 2 (e.g. control forsynchronization between the components), as well as perform zoomcontrol, focus control, and other control.

The controller 5 may be a hardware circuit such as an electronic circuitspecifically designed for implementing predetermined functions, or areconfigurable electronic circuit. The controller 5 may include any ofsemiconductor integrated circuits, such as CPUs, MPUs, microcontrollers,DSPs, FPGAs, and ASICs. The functions of the controller 5 may be builtinto the respective components 2, 3, and 4 of the projection system 1.

The image generator 50 generates image data showing image content to beprojected by the visible light projector 2. The image data is requiredto be generated so that its projection enables the image content tofollow the motion of the subject 6. To this end, the image generator 50performs three-dimensional measurement for a shape of the subject 6 andthe like based on the imaging data received from the camera 4. Operationof the image generator 50 will be described later.

The storage 51 is a storage medium for storing programs and data neededto implement functions of the controller 5. The storage 51 includes ahard disk drive (HDD) or a solid state disk (SSD), for example. Thestorage 51 may further include DRAM, SRAM, or any other semiconductordevice so as to store data temporarily and act as a workspace for thecontroller 5. For, example, the storage 51 stores image data for imagecontent of various kinds and image data for measurement patternsdescribed later.

The screen 10 is an exemplary background member for showing imagecontent which constitutes a background for the subject 6 in theprojection system 1. The screen 10 enables projection of image contentin conjunction with the motion of the subject 6 and enhances stageeffect produced by projection mapping, for example. With reference toFIG. 1, the screen 10 includes a diffusion member 11 and an infraredlight shielding filter 12.

The diffusion member 11 is a screen curtain having a projection surfacefor diffusely reflecting visible light. The screen 10 has a two-layerstructure in which the diffusion member 11 is covered with the infraredlight shielding filter 12 (refer to FIG. 4). The projection surfaceprovided for the screen 10 may be flat or curved.

The infrared light shielding filter 12 includes a film that possessesoptical properties of transmitting visible light components of incidentlight at an average of 50% or more and absorbing infrared lightcomponents of the incident light at an average of 50% or more. Theinfrared light shielding filter 12 forms a light shielding surface forpreventing incident infrared light from being diffusely reflected on theprojection surface of the screen 10. The infrared light shielding filter12 is an exemplary light shielding member for use in the screen 10.

Not limited to the above optical properties, the infrared lightshielding filter 12 may possess an optical property of specularreflection of infrared light, for example. Alternatively, the infraredlight shielding filter 12 may have a retroreflective structurecontaining beads or other materials, for example. The infrared lightshielding filter 12 may be made up of a panel, for example, other thanthe film. Alternatively, the infrared light shielding filter 12 may beformed by means such as application of a coating to the diffusion member11.

2. Operation

Operation of the projection system 1 having the configuration describedabove will now be described.

2-1. Projection Operation (Projection Mapping)

With reference to FIG. 1, projection operation of the projection system1 for performing projection mapping according to this embodiment will bedescribed.

The infrared light projector 3 emits infrared light to project, onto thesubject 6, each measurement pattern in a plurality of measurementpatterns sequentially. The measurement patterns are exemplary invisiblelight images for measurement of a shape and sites of the subject 6 bythe use of a space encoding method. Shapes subject to measurement arethree-dimensional shapes including contours and asperities of an objectlike the subject 6. Sites subject to measurement are three-dimensionalsites including distance to the object. The principle ofthree-dimensional measurement will be described later.

The infrared light projector 3 reads image data stored in the storage 51and forms each measurement pattern shown by the image data at thespatial light modulation device 32 under control of the controller 5,for example. Then, the infrared light projector 3 drives the pulse lightsource 31 to project the measurement pattern using infrared light at anangle of view including a range such as the entire projection surface ofthe screen 10.

The camera 4 captures the measurement pattern projected by the infraredlight projector 3 and outputs imaging data showing an image of thecaptured measurement patterns to the controller 5. The capture operationby the camera 4 is performed for each of the measurement patterns.

The image generator 50 of the controller 5 measures a shape and sites ofthe subject 6 based on the images of the captured measurement patterns,and generates image data that contains image content for projection ontoto the subject 6 according to the measured results.

Specifically, the image generator 50 obtains distances from the owndevice for each pixel on a region of the subject 6 in the capturedpatterns image by using a space encoding method described later, andproduces a distance image that shows the obtained distances to therespective pixels. Based on the produced distance image, the imagegenerator 50 corrects default image data so that image content specifiedby the default image data is appropriately shown at the time of beingprojected to the subject 6 with the measured shape and sites. Thedefault image data is in advance stored in the storage 51, for example.

In this embodiment, the image generator 50 also generates image dataincluding image content for projection onto the screen 10 and outputsthe image data to the visible light projector 2. The storage 51 storesin advance information showing a location and a form (orientation) ofthe screen 10 through calibration at the time of installation of theprojection system 1 or other events, for example. With reference to theinformation described above, the image generator 50 corrects the imagecontent for projection onto the screen 10 at the time of the projectionoperation.

On the basis of the image data from the image generator 50 of thecontroller 5, the visible light projector 2 controls the spatial lightmodulator 22 and emits visible light from the visible light source 21 soas to project the image content onto the subject 6 and the screen 10.

The projection system 1 repeats the processing described above at apredetermined frame rate. This allows image content projected from thevisible light projector 2 to follow the motion of the subject 6 with ahigh degree of precision.

In the projection operation of the projection system 1 described above,improving the accuracy in measurement of a shape and sites of thesubject 6 based on the captured images of measurement patterns projectedby the infrared light projector 3 is important. To achieve the objectiveof improving the measurement accuracy described above, the presentembodiment uses the filters 12 and 43. To achieve the objectivedescribed above, the present embodiment also adopts pulsed lightemission control for the infrared light projector 3. Operation of theprojection system 1 according to this embodiment will now be describedin detail.

2-2. Theory of Three-Dimensional Measurement

The present embodiment adopts space encoding method-based active stereomeasurement as a theory of measuring a shape and the like of the subject6. The theory of this measurement will now be described with referenceto FIGS. 2, 3A, and 3B. FIG. 2 is a drawing for illustrating the theoryof three-dimensional measurement. FIGS. 3A and 3B are drawings forillustrating measurement patterns in accordance with the space encodingmethod.

In FIG. 2, the camera 4 and the infrared light projector 3 are alongsidedisposed such that their respective optical axes are parallel to eachother. Hereinafter, the direction of these optical axes is defined asthe z direction as shown in FIG. 2. A direction that is perpendicular tothe z direction and along which the camera 4 and the infrared lightprojector 3 are aligned each other is defined as the x direction. Adirection perpendicular to the z and x directions is the y direction.

FIG. 2 shows a ray of infrared light emitted from the infrared lightprojector 3 being reflected off a certain point (a luminous point) of anobject and the light reflected from the luminous point being incident onthe camera 4. With reference to FIG. 2, a parallax θ occurs between thecamera 4 and the infrared light projector 3. When the camera 4 capturesan image projected from the infrared light projector 3, the imagecaptured by the camera 4 contains the projected image at a displacementof the parallax θ. In other words, the x coordinate of a luminous pointof the object on the image captured by the camera 4 varies with distanceto the luminous point, as shown in FIG. 2.

In the projection system 1, the controller 5 (the image generator 50)performs a calculation based on the coordinate variation described aboveto measure distance in the z direction by using a trigonometric approachin which the interval between the camera 4 and the infrared lightprojector 3 is taken as a base length. The base length is obtained inadvance through calibration at the time of installation of theprojection system 1 or other events, for example. The coordinatevariation is determined using measurement patterns in accordance withthe space encoding method. A method of this determination will now bedescribed with reference to FIGS. 3A and 3B.

FIG. 3A illustrates image data showing a set of measurement patterns 81,82, and 83 projected from the infrared light projector 3. Themeasurement patterns 81, 82, and 83 each include at least one luminousregion R1 and at least one non-luminous region R0 that are disposedalong a direction of the x coordinate subject to determination ofvariation. According to the space encoding method, the x coordinate onimage data is coded by the correspondence of the luminous region R1 to“1” and the non-luminous region R0 to “0”. In the illustration of FIG.3A, the three measurement patterns 81, 82, and 83 generate 3-bit codesthat correspond to eight regions on the image data.

FIG. 3B illustrates captured images Im1, Im2, and Im3 that are generatedwhen the camera 4 captures the object after projection of themeasurement patterns 81, 82, and 83 of FIG. 3A onto the object. As shownin FIG. 3B, the x coordinate of luminous points of the object on thecaptured images varies with the depth dimension on the object even ifthe luminous points are associated with an identical code “110”. In thisembodiment, the controller 5 determines the coordinate variation bydecoding imaging data showing the captured images Im1, Im2, and Im3 atthe image generator 50.

Specifically, the controller 5 performs threshold judgement for eachpixel in one frame of a captured image by comparing the brightness ofthe pixel with a predetermined threshold. The predetermined threshold isa reference threshold value for determining pixels in the captured imagein which the pixels reflect luminous points as luminous regions in themeasurement pattern. For example, the threshold value is set inconsideration of the amount of noise light. In the threshold judgement,the controller 5 assigns “1” to the pixel determined that the brightnessexceeds the threshold, and “0” to the pixel determined that thebrightness does not exceed the threshold.

The controller 5 performs the processing described above on all thecaptured images Im1, Im2, and Im3. The controller 5 decodes the imagingdata by compiling two values (“0” or “1”) assigned to the pixels each.At this time, the controller 5 may extract a region corresponding to thesubject from the imaging data, for example, by removing regions in whichthe brightness of each pixel does not exceed the threshold from all thecaptured images Im1, Im2, and Im3.

The controller 5 determines x coordinate variation by comparing the xcoordinate value derived from the decoded result with the reference xcoordinate value for every pixel. The controller can determine ycoordinate variation as well in like manner with the description above,for example, by using measurement patterns that are obtained through a90-degree rotation of the measurement patterns 81, 82, and 83 of FIG.3A. If a parallax occurs between the infrared light projector 3 and thevisible light projector 2 as well, the controller obtains informationshowing installation locations of the two projectors in advance andconverts three-dimensional coordinates defined for the infrared lightprojector 3 into three-dimensional coordinates defined for the visiblelight projector 2 as appropriate, for example.

2-3. Filters

With reference to FIG. 4, functions of the infrared light shieldingfilter 12 and the visible light shielding filter 43 according to thisembodiment will be described. FIG. 4 is a drawing for illustratingfunctions of these filters of the projection system 1.

In this embodiment, the visible light projector 2 projects image contentonto the screen 10 as well as the subject 6 (refer to FIG. 1). In orderto enable viewers or the like to visually identify image contentprojected on the screen 10, the visible light from the visible lightprojector 2 needs to be diffusely reflected on the screen 10 as shown inFIG. 4. Meanwhile, if the infrared light from the infrared lightprojector 3 is also diffusely reflected on the screen 10, the boundarybetween a region of the subject 6 and the other region in measurementpattern images captured with the camera 4 will be indistinct.

To address this problem, the screen 10 of this embodiment includes theinfrared light shielding filter 12 for preventing diffuse reflection ofthe infrared light on the projection surface of the screen 10 (see FIG.4). As a result, out of the measurement pattern projected from theinfrared light projector 3, a projected part onto the screen 10 does notappear in an image captured with the camera 4, but a residual partprojected onto the subject 6 just appears in the captured image. Thisconfiguration makes an outline of the subject 6 distinct in the capturedimage by the camera 4 and thereby enables the determination of a shapeand sites of the subject 6 with a high degree of precision.

The screen 10 includes the diffusion member 11 for diffusely reflectingvisible light and the infrared light shielding filter 12 that covers thediffusion member 11. With reference to FIG. 4, the infrared lightshielding filter 12 transmits visible light so as to keep the diffusereflection of visible light on the projection surface of the screen 10.This configuration allows the screen 10 to ensure visibility of imagesprojected from the visible light projector 2.

With reference to FIG. 4, the camera 4 of this embodiment is providedwith the visible light shielding filter 43 that cuts off visible lightcomponents and transmits infrared light components of light entering thecamera 4. This configuration allows the camera 4 to capture themeasurement pattern projected from the infrared light projector 3 with ahigh degree of precision regardless of timing when the visible lightprojector 2 emits visible light for projecting an image.

Other than absorption of infrared light, prevention of diffusereflection at a light shielding surface 10 a of the screen 10 may beachieved by any process such as specular reflection or retroreflectionof infrared light at the infrared light shielding filter 12. Whenspecular reflection is employed, the captured image may include a lightsource image of the infrared light projector 3 with the light shieldingsurface 10 a acting as a mirror plane. In this case, the controller 5may determine a region of the light source image in the captured imagebased on light quantity, location, or the like to remove the lightsource image, for example. When retroreflection is employed, the filterreflects infrared light emitted from the infrared light projector 3toward the infrared light projector 3 and thus prevents the light fromentering the camera 4.

2-4. Pulsed Light Emission Control

With reference to FIG. 5, pulsed light emission control for themeasurement patterns according to this embodiment will now be described.FIG. 5 is a drawing for illustrating a function of pulsed light emissioncontrol in the projection system 1.

With reference to FIG. 5, rays of light reflected on the subject 6include infrared light from the infrared light projector 3, as well asvisible light from the visible light projector 2 and extraneous light.Extraneous light typically includes visible light components andinfrared light components. When the camera 4 is exposed with thereflected rays of light other than infrared light from the infraredlight projector 3, these rays of light causes noise that decreases theaccuracy in measurement of the subject 6 on the basis of capturedimages.

To address this problem, the pulse light source 31 (FIG. 1) of theinfrared light projector 3 according to this embodiment projects themeasurement pattern by emitting pulsed infrared light such that theemitted infrared light is quantitatively concentrated for a duration ofa pulse width (FIG. 5). The camera 4 captures an image insynchronization with timing for emission of a pulse of infrared light.According to this configuration, in the total amount of light exposureby the camera 4, a share of the infrared light emitted from the infraredlight projector 3 can be significantly larger than other share of thenoise such as the extraneous light. This leads to an improvedsignal-to-noise ratio in the accuracy of measurement of the subject 6.Further, mitigated effects of extraneous light on the measurementaccuracy contribute to increased flexibility in installation of theprojection system 1.

With reference to FIGS. 6A to 6G, a timing for control of the projectionsystem 1 according to this embodiment will now be described in detail.

FIGS. 6A, 6B, and 6C illustrate respective timings of red light (R),green light (G), and blue light (B) emitted by the visible lightprojector 2. With reference to FIGS. 6A to 6C, the visible lightprojector 2 of this embodiment drives the visible light source 21(FIG. 1) so as to emit red, green, and blue light each continuouslyduring a frame period T1 for projection of one frame of an image. As aresult, the amount (the maximum amount) of red, green, and blue lightcan be set to a larger value than those set in cases where these colorsof light are emitted in timeshared systems, and thus projected imagescan be made high quality, for example. The frame period T1 is set to1/200 second or smaller, for example, to allow an image to follow amoving subject.

FIG. 6D illustrates a timing of infrared light emitted by the infraredlight projector 3. With reference to FIG. 6D, the infrared lightprojector 3 periodically emits pulsed infrared light with the timingsuperposed on the period for light emission by the visible lightprojector 2. As a result, the respective amounts of visible and infraredlight can be set to larger values than those set in cases where thesetypes of light are emitted in timeshared systems, for example.

In this embodiment, the infrared light projector 3 projects one frame ofa measurement pattern per one pulsed light emission, for example. Thelength of a pulse cycle, i.e. a repetition period for pulsed lightemission, is set to a length identical to the frame period T1 for thevisible light image. The amount of infrared light emitted per one pulsedlight emission is set with reference to the amount of visible lightallowed to be emitted by the visible light projector 2, for example, andcan be set to an amount greater than or equal to the amount of visiblelight allowed to be emitted during the frame period T1 or the sameperiod as a width of the pulse.

FIG. 6E illustrates a timing of image capture by the camera 4. At theimage capturing, the camera 4 exposes in synchronization with thelight-emitting timing of the infrared light projector 3, as shown inFIGS. 6D and 6E. This enables the camera 4 to capture an image everyframe period T1. FIGS. 6F and 6G illustrate details about the frameperiod T1 of FIGS. 6D and 6E.

With reference to FIGS. 6F and 6G, the camera 4 of this embodimentexposes during a period T2, which has the same timing as the emission ofpulsed measurement light and the same length as the pulse width. Thepulse width of the emitted light pulse is set to a length of timebetween 0.1 picoseconds and 20 microseconds, for example. Thisconfiguration can make the peak amount of pulsed light emissionsignificantly high while avoiding the occurrence of widening thewavelength band of measurement light due to an excessively shortenedperiod for pulsed light emission. From a similar perspective, the dutyratio of the pulsed light emission is set to a value between 1/100 and1/10000, for example. A pulse frequency associated with the pulse cyclemay be set to somewhere between 200 Hz and 1 GHz as appropriate toensure a frame rate of the captured image for following a movingsubject.

3. Effects and the Like

As described above, the projection system 1 according to this embodimentprojects an image fit for a shape of an object such as the subject 6.The projection system 1 includes the infrared light projector 3, thescreen 10, the camera 4, the image generator 50, and the visible lightprojector 2. The infrared light projector 3 projects the measurementpatterns 81 to 83 onto the object through invisible infrared light. Thescreen 10 is disposed behind the object in the direction of infraredlight emitted from the infrared light projector 3. The camera 4 capturesan image of the measurement patterns 81 to 83 projected from theinfrared light projector 3. The image generator 50 measures a shape ofthe object based on the image captured by the camera 4 to generate imagedata showing image content for projection onto the object in accordancewith the measured shape. The visible light projector 2 projects theimage content shown by the image data onto the object via visible light.The screen 10 includes the light shielding surface 10 a that does notdiffusely reflect the infrared light incident thereon.

In the projection system 1 described above, the light shielding surface10 a prevents the infrared light emitted from the infrared lightprojector 3 from being diffusely reflected. This configuration enablesthe projection system 1 for projecting images according to object shapesto measure a shape of an object such as the subject 6 with a high degreeof precision.

In this embodiment, the screen 10 absorbs infrared light at the lightshielding surface 10 a without diffuse reflection. The screen 10 mayimplement specular reflection or retroreflection without diffusereflection. This mechanism prevents diffuse reflection of infrared lightat the light shielding surface 10 a and thus improves the accuracy ofmeasurement of the object.

In this embodiment, the screen 10 diffusely reflects visible light. Thisenables the screen 10 to be projected images visibly from the visiblelight projector 2 and enhance stage effect produced by the projectionsystem 1.

The screen 10 according to this embodiment includes the infrared lightshielding filter 12 and the diffusion member 11. The infrared lightshielding filter 12 constructs the light shielding surface 10 a with thevisible light transmitting. The diffusion member 11 is covered with theinfrared light shielding filter 12, and diffusely reflects visiblelight. According to the two-layer structure of the diffusion member 11and the infrared light shielding filter 12, the light shielding surface10 a capable of diffusely reflecting of visible light can be easilyconstructed.

In this embodiment, the camera 4 includes the silicon-containing imagepick-up device 41 and the visible light shielding filter 43 thattransmits infrared light and absorbs or reflects visible light. Thisconfiguration allows the camera 4 to cut off visible light even if theimage pick-up device 41 has sensitivity to light in the visiblespectrum. The visible light shielding filter 43 may be omitted in thecase that an image pick-up device without sensitivity to light in thevisible spectrum is used for example.

In this embodiment, the visible light shielding filter 43 is attached tothe imaging lens 42 in the camera 4. The visible light shielding filter43 may be a filter that is built into the image pick-up device 41 orthat is integrated with the imaging lens 42 in the camera 4.

Further, the projection system 1 according to this embodiment includesthe infrared light projector 3, the camera 4, the image generator 50,and the visible light projector 2. The infrared light projector 3 emitspulsed infrared light to project the measurement patterns 81, 82, and83. The image generator 50 generates image data based on the images Im1,Im2, and Im3 captured in accordance with timings for each pulsed lightemissions.

In the projection system 1 described above, the infrared light projector3 projects the measurement patterns 81, 82, and 83 by emitting pulsedinfrared light such that the emitted light is quantitativelyconcentrated for each period of the infrared light pulse width. Thiscontributes to an improvement in the captured images Im1, Im2, and Im3in terms of signal-to-noise ratio. This configuration enables theprojection system 1 to measure a shape of an object like the subject 6with a high degree of precision.

In this embodiment, the pulse width of the pulsed light emitted by theinfrared light projector 3 is smaller than one frame period theprojected image by the visible light projector 2. The amount of pulsedlight emitted for a duration of the pulse width is larger than theamount of visible light emitted by the visible light projector 2 for thesame duration.

As a result, the amount of pulsed light emission can be substantiallylarger than the amount of visible light emitted from the visible lightprojector 2 for the duration of the pulse width. This configurationenables the projection system 1 to measure an object with improvedprecision.

In this embodiment, the camera 4 captures an image in synchronizationwith the pulsed light emission by the infrared light projector 3. Thisconfiguration enables the camera 4 to capture images that are improvedin signal-to-noise ratio through pulsed light emission.

In this embodiment, the infrared light projector 3 includes the pulselight source 31 including a pulse laser device. The pulse laser deviceenables the projector to emit a large amount of light in oscillatingpulses.

In this embodiment, invisible light images projected by the infraredlight projector 3 are the measurement patterns 81 to 83 in accordancewith a space encoding method. Any other invisible light images can beused such as random dot patterns.

Second Embodiment

A second embodiment will now be described with reference to the attacheddrawings. In the first embodiment, timing for exposure of the camera 4coincides with timing for emission of pulsed light from the infraredlight projector 3 when the camera 4 captures an image in synchronizationwith the emission of pulsed light. In the second embodiment, timing forexposure of a camera 4 is delayed for a period with respect to timingfor pulsed light emission such that synchronization is achieved.

A projection system 1 according to this embodiment will now bedescribed. As for some configuration and operation identical to those ofthe projection system 1 according to the first embodiment, redundantdescriptions thereof are omitted.

FIG. 7A illustrates a timing for emission of pulsed infrared light fromthe infrared light projector 3. FIG. 7B illustrates a timing whenreflected infrared light after pulse emission in FIG. 7A enters thecamera 4. FIG. 7C illustrates a timing for exposure of the camera 4 incoincidence with the timing for pulsed light emission of FIG. 7A. FIGS.7D, 7E, and 7F illustrate a timing for emission of pulsed infrared lightfrom an infrared light projector 3, a timing for reflected light entry,and a timing for exposure of a camera 4 to light, respectively inaccordance with the present embodiment.

FIGS. 7A, 7B, and 7C show an exemplary operation of the projectionsystem in which the timing for exposure of the camera 4 coincides withthe timing for pulsed light emission. The example of FIGS. 7A to 7Cassumes that an object at a distance of roughly 150 m is measured withthe pulse width set to 2 microseconds. In this instance, reflectedinfrared light traveling at the velocity of light (substantially 3×10⁸m/second) enters the camera 4 after a lapse of substantially 1microsecond following the timing for pulsed light emission, as shown inFIG. 7B. The means that if the timing for exposure of the camera 4coincides with the timing for pulsed light emission, the camera 4 isexposed only to roughly half the total amount of reflected lightincident on the camera 4, as shown in FIG. 7C.

To offset this disadvantage, as shown in FIGS. 7D, 7E, and 7F, thecamera 4 according to this embodiment captures an image insynchronization with pulsed light emission such that exposure of thecamera 4 is delayed for a period Δt with respect to the timing forpulsed light emission. The delay period Δt is based on a referencedistance to the estimated location of an object (a subject) subject toprojection, as well as the velocity of light, and is set to a periodrequired for light to make a round trip of the reference distance.Consequently, with reference to FIGS. 7E and 7F, an overlap between timetaken for light reflected off the object to be incident on the camera 4and time taken for the camera 4 to be exposed to light increases by thedelay period Δt. This configuration can increase the amount of thereflected light exposed by the camera 4 and thereby improve the accuracyin measurement of the object.

The delay period Δt for the projection system 1 is determined in advanceat the time of calibration of the projection system 1 or other events,for example. The delay period may be determined by means, such as a usercommand or at predetermined intervals (e.g. 1 minute), during theprojection operation of the projection system 1. The projection system 1may determine the delay period based on a measured distance to thesubject 6 (located in the z direction).

In the projection system 1 according to this embodiment described above,the camera 4 captures an image every time of the pulsed light emissionwith the delay period Δt from the timing of the pulsed light emission bythe infrared light projector 3. This configuration facilitates anincreased overlap between time taken for light reflected off the objectto be incident on the camera 4 and time taken for the camera 4 to exposeand thus improves the accuracy in measurement of the object.

In this embodiment, the delay period Δt is on the basis of a distance tothe object and the velocity of light. As a result, the delay period Δtcan be adjusted to a period required for pulsed infrared light emittedfrom the infrared light projector 3 to make a round trip of the distanceto the object, so as to increase the amount of the reflected lightexposed by the camera 4 to.

In the embodiment described above, the camera 4 exposes during a periodidentical to the pulse width of emitted infrared light. The exposureperiod for the camera 4 may be set to a length different from the pulsewidth. This variant example will now be described with reference toFIGS. 8A to 8C.

FIGS. 8A, 8B, and 8C illustrate a timing for emission of pulsed infraredlight from the infrared light projector 3, a timing for reflected lightentry, and a timing for exposure of the camera 4, respectively inaccordance with this variant example. With reference to FIG. 8C, theexposure period for the camera 4 according to this variant example isset to a period longer than the pulse width of emitted infrared light.This means that the period required for reflected light entry is insidethe exposure period for the camera 4 even if the timing for exposure ofthe camera 4 does not exactly coincide with the timing for reflectedlight entry. As a result, improvement of the accuracy in measuring theobject can be achieved by a simple circuit configuration withoutexcessively complicated timing control over the camera 4.

The exposure time for the camera 4 is set shorter than a pulse cycle (aperiod T1), i.e. a time interval between emissions of pulsed light fromthe infrared light projector 3, and set to shorter than or equal to halfthe interval between emissions of pulsed light, for example. Theexposure time for the camera 4 may be set to shorter than or equal tomultiple times (e.g. 10 times) the pulse width of emitted light. In suchcases, the delay period Δt may be omitted.

Third Embodiment

A third embodiment will now be described with reference to the attacheddrawings. The camera 4 according to each embodiment described abovecaptures an image in synchronization with emission of pulsed light bythe infrared light projector 3. In the third embodiment, an imagegenerator 50 extracts a captured image in accordance with a timing forpulsed light emission, whereas a camera 4 captures images withoutsynchronization with the pulsed light emission.

A projection system 1 according to this embodiment will now bedescribed. As for some configuration and operation identical to those ofthe projection systems 1 according to the first and second embodiments,redundant descriptions thereof are omitted.

FIGS. 9A, 9B, and 9C illustrate a timing for emission of pulsed infraredlight from an infrared light projector 3, a timing for reflected lightentry, and a timing for exposure of the camera 4 to light, respectivelyin accordance with the present embodiment.

With reference to FIG. 9C, the camera 4 according to this embodimentdoes not synchronize with the timing for pulsed light emission (FIG. 9A)but repeatedly captures images at a predetermined repetition period.This configuration can omit devices, such as a synchronous signalsource, for use that gets the camera 4 to capture an image insynchronization with emission of pulsed light.

With reference to FIGS. 9B and 9C, the repetition period at which thecamera 4 according to this embodiment captures images is set shorterthan the pulse width of emitted light. This means that a period when thereflected light continues to be incident on the camera 4 includes anexposure period for the camera, and an image captured during that periodis generated. These images are captured with less extraneous light andother noise components relative to the amount of reflective light andthus allow measurement of an object at a high signal-to-noise ratio.

The image generator 50 extracts captured images generated in the waydescribed above among images captured successively by the camera, andperforms processing such as decoding measurement patterns according tothe extracted images. A storage 51 stores in advance informationregarding a period required for reflected light to make the round trip,and the image generator 50 extracts the captured images described abovebased on that information and the timing for pulsed light emission, forexample.

In the projection system 1 according to this embodiment described above,the camera 4 repeatedly captures images by a time interval shorter thana repetition interval between emissions of the pulsed light by theinfrared light projector 3. The image generator 50 extracts capturedimages in accordance with the timings for pulsed light emission amongimages repeatedly captured by the time interval. This enablesthree-dimensional measurement of an object with a high degree ofprecision on the basis of captured images extracted by the imagegenerator 50. This configuration can omit functions such as control ofthe camera 4 for synchronization and reduce costs.

In the embodiment described above, the period at which the camera 4repeats capture of images may be set to longer than or equal to thepulse width of emitted light. This variant example will now be describedwith reference to FIGS. 10A to 10C.

FIGS. 10A, 10B, and 10C illustrate a timing for emission of pulsedinfrared light from the infrared light projector 3, a timing forreflected light entry, and a timing for exposure of the camera 4 tolight, respectively in accordance with this variant example.

With reference to FIGS. 10A and 10C, the period at which the camera 4repeats capture of images in this variant example is longer than orequal to the pulse width of emitted light and shorter than or equal toone half of a pulse cycle, the pulse cycle being the time intervalbetween emissions of pulsed light from the infrared light projector 3.The exposure period for the camera to capture an image is set to longerthan or equal to the pulse width and shorter than or equal to one halfof the pulse cycle, for example.

In this case, with reference to FIGS. 10B and 10C, one half or more ofthe period required for reflected light to be incident on the camera 4is inside one exposure period for the camera, and an image capturedduring that period is periodically generated. Such images are capturedwith a smaller amount of extraneous light than that for one pulse cycleand allow three-dimensional measurement of the object with mitigatedeffects of noise. The image generator 50 extracts these captured imagesdescribed above and generates image data based on the extracted capturedimages so as to provide image content that follows the motion of theobject.

Other Embodiments

The first to third embodiments described above are provided toillustrate techniques disclosed in this patent application. Techniquesaccording to the present disclosure, however, can be applied to anyvariations to which change, replacement, addition, omission, or the likeare appropriately made, other than the embodiments described above. Anew embodiment can be made by combining some constituent elements in anyof the embodiments described above. In light of this, other embodimentswill be exemplified.

In the embodiments described above, the screen 10 is taken as an exampleof background members that diffusely reflects visible light. Thebackground member according to the present disclosure is not limitedthereto, but may use any materials that absorb or transmit visiblelight, for example. When the visible light projector 2 of the projectionsystem 1 projects no image content onto the background member, thebackground member may be a blackout curtain that absorbs visible lightwithout permitting diffuse reflection of infrared light, for example.When the projection system 1 uses an external screen or in similarcases, an infrared light shielding filter that transmits visible light,a light-shielding cover or curtain, or any other light-shieldingmaterial may be used as a background member.

In the embodiments described above, the projection system 1 includes thebackground member and the controls emission of pulsed invisible light.The scope of the present disclosure is not limited to such aconfiguration. When the projection system 1 includes a backgroundmember, the control over emission of pulsed invisible light may beomitted. Likewise, the projection system 1 may omit the backgroundmember when the system controls emission of pulsed invisible light. Ineither of the instances, the projection system that projects imagecontent fit for a shape of an object can measure the shape of the objectwith a high degree of precision.

When the system omits the control over emission of pulsed invisiblelight, the infrared light projector 3 may replace the pulse light source31 with another light source that includes a continuous wave laser or alight emitting diode.

When the system controls emission of pulsed invisible light, the visiblelight shielding filter 43 may be omitted. In this case, by setting ofthe amount of pulsed light emission and a threshold forthree-dimensional measurement appropriately, the system can measure theshape of the object based on captured images with a high degree ofprecision.

In the embodiments described above, the visible light projector 2 emitsred, green, and blue light each continuously, for example. However, theprojector may emit red, green, and blue light in a timeshared system.Further, these colors of visible light as well as infrared light fromthe infrared light projector 3 may be emitted in a timeshared system.

In the embodiments described above, the projection system 1 lets imagecontent follow the subject 6, for example. An object subject toprojection in a projection system according to the present disclosure isnot limited to a moving object, but may be a stationary object, such asa building. If the stationary object is subject to projection in theprojection system, the site of the object may not necessarily bemeasured during projection operation.

The embodiments described above are provided to illustrate techniquesaccording to the present disclosure. For that purpose, the accompanyingdrawings and detailed description are provided.

Consequently, the accompanying drawings and detailed descriptionprovided to illustrate the techniques described above may includeconstituent elements that are not essential for resolving problems aswell as those essential for resolving problems. Thus, thesenon-essential constituent elements, if they are included in theaccompanying drawings or detailed description, should not be regarded asessential constituent elements.

Since the embodiments described above are provided to illustratetechniques according to the present disclosure, various kinds of change,replacement, addition, omission, or the like may be made to theseembodiments without departing from the scope of the claims andequivalents thereof.

INDUSTRIAL APPLICABILITY

The projection system according to the present disclosure is availablefor a variety of uses where image content is projected onto an object.

1. A projection system comprising: a first projector that projects alight of a first wavelength onto an object; an imaging device thatcaptures an image formed by the light of the first wavelength projectedfrom the first projector; an image generator that measures a shape ofthe first object based on the image captured by the imaging device togenerate image data indicating a projection image in accordance with themeasured shape; a second projector that projects the projection imageindicated by the image data by using a light of a second wavelengthdifferent from the first wavelength, wherein the first projector emitspulsed light of the first wavelength with a pulse width being smallerthan one frame period of the projected image by the second projector,and an amount of the pulsed light emitted for a duration of the pulsewidth being larger than an amount of the light of the second wavelengthemitted by the second projector for the same duration, and the imagegenerator generates the image data based on an image captured inaccordance with a timing of the pulsed light emission.
 2. The projectionsystem of claim 1, wherein the imaging device captures the image insynchronization with the pulsed light emission.
 3. The projection systemof claim 2, wherein the imaging device captures the image every time ofthe pulsed light emission with a predetermined delay period from atiming of the pulsed light emission.
 4. The projection system of claim3, wherein the delay period is on the basis of a distance to the objectand the velocity of light.
 5. The projection system of claim 1, whereinthe imaging device repeatedly captures images by a time interval shorterthan a repetition interval between emissions of the pulsed light of thesecond wavelength, and the image generator extracts the image capturedin accordance with the timing of the pulsed light emission from theimages repeatedly captured.
 6. The projection system of claim 1, whereinan exposure period for the imaging device to capture the image isshorter than or equal to half of a pulse cycle for the pulsed lightemission.
 7. The projection system claim 1, wherein the first projectorcomprises a pulsed light source including a pulsed laser device
 8. Theprojection system of claim 1, wherein the light of the first wavelengthis an invisible light.
 9. The projection system of claim 8, wherein theinvisible light is infrared light.
 10. The projection system of claim 1,wherein an image formed by the light of the first wavelength, projectedonto the object is a measurement pattern in accordance with a spaceencoding method.
 11. A projection method comprising: projecting a lightof a first wavelength onto an object by a first projector; capturing byan imaging device, an image formed by the light of the first wavelengthprojected from the first projector; measuring a shape of the objectbased on the image captured by the imaging device; generating by animage generator, image data indicating a projection image in accordancewith the measured shape; and projecting by a second projector, theprojection image indicated by the image data by using a light of asecond wavelength different from the first wavelength, wherein theprojecting of the light of the first wavelength comprises emitting, bythe first projector, pulsed light of the first wavelength with a pulsewidth being smaller than one frame period of the projected image by thesecond projector, and an amount of the pulsed light emitted for aduration of the pulse width being larger than an amount of the light ofthe second wavelength emitted by the second projector for the sameduration, and the image data is generated based on an image captured inaccordance with a timing of the pulsed light emission.
 12. Theprojection method of claim 11, wherein the imaging device captures theimage in synchronization with the pulsed light emission.
 13. Theprojection method of claim 12, wherein the imaging device captures theimage every time of the pulsed light emission with a predetermined delayperiod from a timing of the pulsed light emission.
 14. The projectionmethod of claim 13, wherein the delay period is on the basis of adistance to the object and the velocity of light.
 15. The projectionmethod of claim 11, wherein the imaging device repeatedly capturesimages by a time interval shorter than a repetition interval betweenemissions of the pulsed light of the second wavelength, and the imagegenerator extracts the image captured in accordance with the timing ofthe pulsed light emission from the images repeatedly captured.
 16. Theprojection method of claim 11, wherein an exposure period for theimaging device to capture the image is shorter than or equal to half ofa pulse cycle for the pulsed light emission.
 17. The projection methodclaim 11, wherein the first projector comprises a pulsed light sourceincluding a pulsed laser device.
 18. The projection method of claim 11,wherein the light of the first wavelength is an invisible light.
 19. Theprojection method of claim 18, wherein the invisible light is infraredlight.
 20. The projection method of claim 11, wherein an image formed bythe light of the first wavelength, projected onto the object is ameasurement pattern in accordance with a space encoding method.